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IEEE
Communications Society The IEEE CQR International Workshop is held annually with the purpose of bringing together industry and academic experts to present and discuss communications quality, reliability and security issues as they relate to real world issues. The output from the workshops adds to the community's body of knowledge and serves to inform, help form opinion, and to assist in the development of best practice and relevant standards. Continuing the tradition of this series of workshops, CQR 2011 will provide an international technical forum for experts from industry and academia to exchange ideas and present results of ongoing research in the areas listed below. This year, special focus will be on the challenging issues related to the requirements, metrics, measurement, management, and dissemination of Communications Quality & Reliability. You are invited to submit a paper related to various aspects of QoS and Reliability for the following networks/services:
The detailed technical area includes:
For additional information on this CFP, please contact:
Professor Yutaka Ishibashi, Nagoya Institute of Technology, Nagoya,
Japan Please note that, CQR2011 has two programs: Technical and Strategic. The above Call For Paper covers the Technical Program only. The industry focused Strategic Program is organized separately. For more information on the Strategic Program, please visit the CQR2011 website or contact the General Program Co-Chairs. |
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Technical Paper Submission Guidelines Papers should describe
original work, and be 4-6 two-column and single-spaced
pages or less in IEEE conference style.
The cover page should clearly indicate the complete
postal and electronic mailing addresses, as well as the phone
and fax numbers of the contact author. Paper submissions must
be made electronically via e-mail attachment in PDF format
to Download the Call For Paper |
General Program Co-Chairs
Scott Poretsky, Allot Communications, USA
Michael Ryan, Verizon Wireless, USA Technical Program Chair |
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Papers accepted for CQR 2011 will be included in the Workshop Proceedings, IEEE XPlore, and EI Index, with the exception that IEEE reserves the right to exclude any paper from distribution after the conference (e.g., removal from IEEE Xplore) if the paper is not presented at the conference. Papers that are removed from IEEE Xplore will not be available through the EI Index. |
Key Dates Dec. 13, 2010
Paper submission deadline |
Technical Program Committee (TPC) Members
|
Name |
Affiliation |
Name |
Affiliation |
|
Yutaka Ishibashi (Chair) |
Nagoya Institute of Technology, Japan |
Jun Li |
Communications Research Centre, Canada |
|
Paolo Bellavista |
Universita di Bologna, Italy |
Anil Macwan |
Alcatel-Lucent, USA |
|
Rocky K. C. Chang |
The Hong Kong Polytechnic University, HK |
Takumi Miyoshi |
Shibaura Institute of Technology, Japan |
|
Chi-Ming Chen |
AT&T, USA |
Tutomu Murase |
NEC, Japan |
|
Eric Chen |
NTT, Japan |
Hidenori Nakazato |
Waseda University, Japan |
|
Kuan-Ta Chen |
Academia Sinica, Taiwan |
Hitoshi Ohnishi |
The Open University of Japan |
|
Hiroshi Fujinoki |
Southern Illinois University, USA |
Shinji Sugawara |
Nagoya Institute of Technology, Japan |
|
Stefano Giordano |
University of Pisa, Italy |
Dan Keun Sung |
KAIST, Korea |
|
Fabrizio Granelli |
University of Trento, Italy |
Sandra Tartarelli |
NEC, Germany |
|
Go Hasegawa |
Osaka University, Japan |
Ning Wang |
University of Surrey, UK |
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Toru Hasegawa |
KDDI R&D Laboratories Inc., Japan |
Katsunori Yamaoka |
Tokyo Institute of Technology, Japan |
|
Kenji Hikichi |
Fujitsu, Japan |
Tatsuya Yamazaki |
NICT, Japan |
|
Hideaki Imaizumi |
University of Tokyo, Japan |
Tokumi Yokohira |
Okayama University, Japan |
|
Ryoichi Kawahara |
NTT, Japan |
Tetsuya Yokotani |
Mitsubishi Electric Corporation, Japan |
|
JongWon Kim |
Gwangju Institute of Science and Technology, Korea |
Homayoun Yousefi'zadeh |
University of California, Irvine, USA |
|
Aki Kobayashi |
Kogakuin University, Japan |
Weider Yu |
San Jose State University, USA |
C Q R Officers (2010-2011)
|
Chair |
Hiromi Ueda, Tokyo University
of Technology, Japan |
Last updated on Tuesday, August 17, 2010
